PICMUS is part of the IEEE IUS 2016, Tours, France.
Points will be distributed to the challengers according to 5 metrics calculated from their reconstructed images.
Two metrics (resolution, contrast) are used to increase the number of points received by a challenger.
In case a proposed method is not geometrically accurate or if the reconstructed speckle is not preserved a penalyzation will be applied to the challenger.
Each positive metric will lead to a value bounded between 0 (worst result among the participants) and 100 (best results among the participants) whereas each penalyzation will cost 40 points (see details in the sub categories).